Contact probe is a measuring needle, which is made up of 2 microscopic pins(φ1mm or smaller) , 1 pipe with 1 spring, used in the inspection process (to differentiate non-defective items from defective ones) of semiconductors.
As electronic equipment and hi-tech products handled by people all over the world have become more and more compact and tiny, semiconductors and the contact probes to inspect them have been increasing required to be even more precise and minuscule.
At AIKOSHA, we continue our quest in refinement and minimization alongside the semiconductor industry.